Название: Machine Vision Inspection Systems: Machine Learning-Based Approaches (Machine Vision Inspection Systems, Volume 2)
Автор: Muthukumaran Malarvel (Editor), Soumya Ranjan Nayak (Editor), Prasant Kumar Pattnaik (Editor)
Издательство: Wiley
Год: 2021
Формат: True PDF
Страниц: 337
Размер: 28.4 Mb
Язык: English
Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry.