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Название: Atomic Force Microscopy for Energy Research
Автор: Edited by Cai Shen
Издательство: CRC Press
Год: 2022
Страниц: 457
Размер: 51,49 МБ
Формат: PDF
Язык: English
Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed.