Автор: Ricardo Reis and Yu Cao
Издательство: Springer
Год: 2014
Формат: PDF
Размер: 12,3 Мб
Язык: английский / English
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.