Название: On-Wafer Microwave Measurements and De-embeddingАвтор: Errikos Lourandakis
Издательство: Artech House
Год: 2016
Формат: PDF
Размер: 6 Мб
Язык: английский / English
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.