
Автор: Selahattin Sayil
Издательство: Springer
Серия: Synthesis Lectures on Digital Circuits & Systems
Год: 2022
Страниц: 142
Язык: английский
Формат: pdf (true), epub
Размер: 16.3 MB
As CMOS technology advances, circuits are exposed to various noise sources that impact circuit performance and reliability in nanometerscale integrated circuits. The reliability of the integrated circuits is being severely challenged, as many previously negligible noise effects are becoming more prominent, causing significant performance and reliability degradations of nanometer integrated circuits. Various noise sources exist in a nanometer circuit including crosstalk noise induced by signal switching on neighboring wires, power supply noise on power grid lines due to simultaneous switching events, substrate coupling noise, noise due to process and environmental variations, thermal noise and radiation-induced soft errors. The impacts of these noise sources are far more severe for clock lines since clock signal controls the data processing.