Название: Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
Автор: Sebastian Huhn, Rolf Drechsler
Издательство: Springer
Год: 2021
Страниц: 177
Язык: английский
Формат: pdf (true), epub
Размер: 11.5 MB
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability.